| PART |
Description |
Maker |
| SRF-1016Z SRF-2016Z STQ-1016Z SRQ-2116Z STQ-3016Z |
RELIABILITY QUALIFICATION REPORT
|
List of Unclassifed Manufacturers
ETC[ETC]
N.A.
|
| MAX5028 MAX5027 MAX5026EUT MAX5025 MAX5026 |
500kHz 36V Output SOT23 PWM Step-Up DC-DC Converters
RELIABILITY REPORT FOR MAX5026EUT PLASTIC ENCAPSULATED DEVICES
|
MAXIM - Dallas Semiconductor
MAXIM[Maxim Integrated Products]
|
| XQV1000 XQC100-4CG560M XQC1000-4CG560M XQC300-4CG5 |
QPro Virtex 2.5V QML high-reliability FPGA. SMD number 5962-9957201NNA.
QPro Virtex 2.5V QML High-Reliability FPGAs FPGA, 1536 CLBS, 322970 GATES, PBGA352
QPro Virtex 2.5V QML High-Reliability FPGAs FPGA, 661111 GATES, PBGA432
QPro Virtex 2.5V QML High-Reliability FPGAs QPro的Virtex 2.5V的QML第高可靠性的FPGA
QPro Virtex 2.5V QML high-reliability FPGA. SMD number 5962-9957301NUA
QPro Virtex 2.5V QML high-reliability FPGA. SMD number 5962-9957201NUA.
|
Xilinx, Inc.
|
| 1-1461491-0 2-1461491-0 3-1461491-0 1461491-1 1-14 |
Qualification Test Report
|
Tyco Electronics
|
| MBM29PL3200BE70PFV MBM29PL3200BE70PBT MBM29PL3200B |
32 M (2 M X 16/1 M X 32) BIT 1M X 32 FLASH 3V PROM, 90 ns, PBGA84
Replaced by TPS2046B : 0.345A, 2.7-5.5V Dual (1In/2Out) Hi-Side MOSFET, Fault Report, Act-Low Enable 8-PDIP -40 to 85 32米（2的MX 16 / 1的MX 32）位
Replaced by TPS2046B : 0.345A, 2.7-5.5V Dual (1In/2Out) Hi-Side MOSFET, Fault Report, Act-Low Enable 8-SOIC 0 to 85
|
Fujitsu, Ltd.
Fujitsu Limited
Fujitsu Component Limited.
FUJITSU LTD
Fujitsu Component Limit...
|
| GET-30593 |
Qualification Test Report on NE681XX
|
California Eastern Labs
|
| GET-BC-0004 |
Qualification Test Report on NE292
|
California Eastern Labs
|
| GSIONIRUH33PA13B20K |
Total Ionizing Dose Test Report
|
International Rectifier
|
| EPR-89 |
Engineering Prototype Report for 2.0 W CV Adapter using LNK362P
|
POWERINT[Power Integrations, Inc.]
|
| EPR-16 |
Engineering Prototype Report for EP-16 2.75 W Charger/Adapter Using LNK501
|
Power Integrations, Inc...
|
| TR636E-10164 |
QUALITY EVALUATION TEST REPORT IT3-25H
|
Hirose Electric
|
